An X-ray Spectrometric Technique for Measuring Porcelain-Metal Adherence

R. D. Ringle, J. R. Mackert, C. W. Fairhurst

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

This study demonstrated a correlation between silicon x-ray counts and area fractions of adherent porcelain as determined by point-counting. This correlation has allowed a method to be devised for measuring area fractions of porcelain adherent to porcelain-fused-to-metal (PFM) fracture surfaces. The described method, after controlled destruction of the porcelain mass, uses silicon x-rays excited by the electron beam in a scanning electron microscope. Under the conditions employed in these studies, the x-ray technique has shown that this gold alloy retains more porcelain than does either of two particular nickel-chromium alloys.

Original languageEnglish (US)
Pages (from-to)933-936
Number of pages4
JournalJournal of Dental Research
Volume62
Issue number8
DOIs
StatePublished - Jan 1 1983

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Dental Porcelain
Metals
X-Rays
Silicon
Chromium Alloys
Gold Alloys
Electrons

ASJC Scopus subject areas

  • Dentistry(all)

Cite this

An X-ray Spectrometric Technique for Measuring Porcelain-Metal Adherence. / Ringle, R. D.; Mackert, J. R.; Fairhurst, C. W.

In: Journal of Dental Research, Vol. 62, No. 8, 01.01.1983, p. 933-936.

Research output: Contribution to journalArticle

Ringle, R. D. ; Mackert, J. R. ; Fairhurst, C. W. / An X-ray Spectrometric Technique for Measuring Porcelain-Metal Adherence. In: Journal of Dental Research. 1983 ; Vol. 62, No. 8. pp. 933-936.
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