An X-ray Spectrometric Technique for Measuring Porcelain-Metal Adherence

R. D. Ringle, J. R. Mackert, C. W. Fairhurst

Research output: Contribution to journalArticle

24 Scopus citations

Abstract

This study demonstrated a correlation between silicon x-ray counts and area fractions of adherent porcelain as determined by point-counting. This correlation has allowed a method to be devised for measuring area fractions of porcelain adherent to porcelain-fused-to-metal (PFM) fracture surfaces. The described method, after controlled destruction of the porcelain mass, uses silicon x-rays excited by the electron beam in a scanning electron microscope. Under the conditions employed in these studies, the x-ray technique has shown that this gold alloy retains more porcelain than does either of two particular nickel-chromium alloys.

Original languageEnglish (US)
Pages (from-to)933-936
Number of pages4
JournalJournal of Dental Research
Volume62
Issue number8
DOIs
StatePublished - Aug 1983

ASJC Scopus subject areas

  • Dentistry(all)

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