Detecting Crystallographic Lattice Chirality using Resonant Inelastic X-ray Scattering

Sean Mongan, Zengye Huang, Trinanjan Datta, Takuji Nomura, Dao Xin Yao

Research output: Contribution to journalArticle

Abstract

The control and detection of crystallographic chirality is an important and challenging scientific problem. Chirality has wide ranging implications from medical physics to cosmology including an intimate but subtle connection in magnetic systems, for example Mn1−xFexSi. X-ray diffraction techniques with resonant or polarized variations of the experimental setup are currently utilized to characterize lattice chirality. We demonstrate using theoretical calculations the feasibility of indirect K –edge bimagnon resonant inelastic X-ray scattering (RIXS) spectrum as a viable experimental technique to distinguish crystallographic handedness. We apply spin wave theory to the recently discovered √5 × √5 vacancy ordered chalcogenide Rb0.89Fe1.58Se2 for realistic X-ray experimental set up parameters (incoming energy, polarization, Bragg angle, and experimental resolution) to show that the computed RIXS spectrum is sensitive to the underlying handedness (right or left) of the lattice. A Flack parameter definition that incorporates the right- and left- chiral lattice RIXS response is introduced. It is shown that the RIXS response of the multiband magnon system RbFeSe arises both from inter- and intra- band scattering processes. The extinction or survival of these RIXS peaks are sensitive to the underlying chiral lattice orientation. This in turn allows for the identification of the two chiral lattice orientations.

Original languageEnglish (US)
Article number12771
JournalScientific reports
Volume9
Issue number1
DOIs
StatePublished - Dec 1 2019

ASJC Scopus subject areas

  • General

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