Evaluation of capture-recapture models for estimating the abundance of naturally-occurring defects

Gursimran Singh Walia, Jeffrey C. Carver

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

Project managers can use capture-recapture models to manage the inspection process by estimating the number of defects present in an artifact and determining whether a reinspection is necessary. Researchers have previously evaluated capture-recapture models on artifacts with a known number of defects. Before applying capture-recapture models in real development, an evaluation of those models on naturally-occurring defects is imperative. The data in this study is drawn from two inspections of real requirements documents (that later guided implementation) created as part of a capstone course (i.e. with naturally occurring defects). The major results show that: a) estimators improve from being negatively biased after one inspection to being positively biased after two inspections, b) the results contradict the earlier result that a model that includes two sources of variation is a significant improvement over models with one source of variation, and c) estimates are useful in determining the need for artifact reinspection.

Original languageEnglish (US)
Title of host publicationESEM'08
Subtitle of host publicationProceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement
Pages158-167
Number of pages10
DOIs
StatePublished - 2008
Externally publishedYes
Event2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008 - Kaiserslautern, Germany
Duration: Oct 9 2008Oct 10 2008

Publication series

NameESEM'08: Proceedings of the 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement

Conference

Conference2nd International Symposium on Empirical Software Engineering and Measurement, ESEM 2008
Country/TerritoryGermany
CityKaiserslautern
Period10/9/0810/10/08

Keywords

  • Capture-recapture models
  • Defect estimation, requirements
  • Empirical study
  • Software inspections
  • Validation and verification

ASJC Scopus subject areas

  • Computer Science Applications
  • Software
  • Electrical and Electronic Engineering

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