The interfacial strength and ultrastructure of a total-etch, self-etch and self-adhesive resin cement used to lute endodontic glass fiber posts (FRC Postec, Ivoclar-Vivadent) was assessed with the "thin-slice" push-out test and transmission electron microscopy (TEM). The tested adhesive cements were Variolink II (Ivoclar-Vivadent), Panavia 21 (Kuraray Co) and RelyX Unicem (3M ESPE). In each group, seven posted roots were used for push-out tests and two were processed for TEM observations. The interfacial strength achieved by Variolink II (10.18±2.89 MPa) was significantly higher than Panavia (5.04±2.81 MPa) and RelyX Unicem (5.01±2.63 MPa), which were comparable to each other. TEM micrographs of the interface between Variolink II and intraradicular dentin revealed that the smear layer was totally removed and an 8-10 micron thick hybrid layer was formed. In the other group specimens, the smear layer was not completely dissolved and smear plugs were retained. Gaps were present between the hybridized complex and the adhesive layer in the Panavia 21 specimens and between the smear layer and underlying root dentin in the RelyX Unicem specimens. Interfacial strengths and microscopic findings were in agreement and indicated that the bonding potential of the total-etch resin cement was greater. The acidic-resin monomers responsible for substrate conditioning in Panavia 21 and RelyX Unicem appeared unable to effectively remove the thick smear layer created on root dentin during post space preparation.
|Original language||English (US)|
|Number of pages||9|
|State||Published - Sep 1 2005|
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