Kinetics of Ag nanoparticle growth in thick SiO 2 films: An in situ optical assessment of Ostwald ripening

J. A. Jiménez, M. Sendova

Research output: Contribution to journalArticlepeer-review

5 Scopus citations


Significant progress in understanding physico-chemical changes of noble metal species embedded in dielectrics can be achieved from the real-time monitoring of material optical properties during processing. In this work, in situ optical microspectroscopy is employed in a real-time assessment of the kinetics of Ag nanoparticle (NP) growth in the Ostwald ripening stage for NPs embedded in thick SiO 2 films on soda glass, heat-treated in air atmosphere. The remarkable plasmonic evolution allows for following the variation in NP size in the framework of Mie extinction and crystal growth theories. An Arrhenius-type analysis yields an activation energy of 1.8 eV in association to aforementioned regime of NP growth. The data is discussed in the context of the atmosphere/film/substrate physico-chemical interactions alongside with previously reported results obtained by the proposed novel application of in situ optical microspectroscopy.

Original languageEnglish (US)
Pages (from-to)282-286
Number of pages5
JournalMaterials Chemistry and Physics
Issue number2-3
StatePublished - Aug 15 2012
Externally publishedYes


  • Crystal growth
  • Nanostructures
  • Optical materials
  • Transport properties

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics


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