On reachable set estimation for discrete-time switched linear systems under arbitrary switching

Weiming Xiang, Hoang Dung Tran, Taylor T. Johnson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

This paper addresses the problem of reachable set estimation for discrete-time switched systems under arbitrary switching. By introducing a novel conception called M-step sequence which is capable of characterizing all possible subsystem activation orders during M discrete-time steps, a Lyapunov function based approach is proposed to derive a set of bounding ellipsoids to estimate the reachable set. The proposed approach can cover the previous switched Lyapunov function approach and yields less conservativeness. Moreover, it can be shown that the M-step sequence method can also reduce the conservativeness in stability analysis for discrete-time switched systems under arbitrary switching in contrast to switched Lyapunov function method. Several numerical examples are provided to illustrate our approach.

Original languageEnglish (US)
Title of host publication2017 American Control Conference, ACC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4534-4539
Number of pages6
ISBN (Electronic)9781509059928
DOIs
StatePublished - Jun 29 2017
Externally publishedYes
Event2017 American Control Conference, ACC 2017 - Seattle, United States
Duration: May 24 2017May 26 2017

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Conference

Conference2017 American Control Conference, ACC 2017
CountryUnited States
CitySeattle
Period5/24/175/26/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Xiang, W., Tran, H. D., & Johnson, T. T. (2017). On reachable set estimation for discrete-time switched linear systems under arbitrary switching. In 2017 American Control Conference, ACC 2017 (pp. 4534-4539). [7963654] (Proceedings of the American Control Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ACC.2017.7963654