### Abstract

In this study, a scatter model is derived for parallel-beam, fan-beam, and cone-beam geometries in SPECT imaging. In the model, a photon is allowed to be scattered only once, and the probability of scatter for a given angle and energy is calculated using the Klein-Nishina formula. The detector is assumed to have perfect energy resolution. The scatter counts are computed for every projection array. From the scatter counts, the scatter line source response function and scatter-to-primary ratio are obtained. They agree well with those of Monte Carlo (MC) simulation including only single scattering, but deviate from those of full MC simulation including both single and multiple scattering. The deviation depends on the source depth within the medium. For a source depth of 6 cm, the difference of the scatter-to-primary ratio between the model and full MC simulation is less than 7%, while the difference becomes 27% for parallel-beam and 32% for cone-beam geometry at a source depth of 21.6 cm. Since scatter accounts for 20-40% of the total counts in most clinical studies, the scatter model yields a SPR accuracy ranged from 3% to 12%. The scatter model provides an efficient mean of characterizing scatter response with reasonable accuracy, and can be used in developing scatter compensation techniques in converging-beam SPECT.

Original language | English (US) |
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Title of host publication | IEEE Nuclear Science Symposium & Medical Imaging Conference |

Publisher | Publ by IEEE |

Pages | 1179-1183 |

Number of pages | 5 |

Edition | pt 2 |

ISBN (Print) | 0780314875 |

State | Published - Jan 1 1994 |

Event | Proceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference - San Francisco, CA, USA Duration: Oct 30 1993 → Nov 6 1993 |

### Publication series

Name | IEEE Nuclear Science Symposium & Medical Imaging Conference |
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Number | pt 2 |

### Other

Other | Proceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference |
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City | San Francisco, CA, USA |

Period | 10/30/93 → 11/6/93 |

### Fingerprint

### ASJC Scopus subject areas

- Computer Vision and Pattern Recognition
- Industrial and Manufacturing Engineering

### Cite this

*IEEE Nuclear Science Symposium & Medical Imaging Conference*(pt 2 ed., pp. 1179-1183). (IEEE Nuclear Science Symposium & Medical Imaging Conference; No. pt 2). Publ by IEEE.

**Scatter model for parallel and converging beam SPECT based on the Klein-Nishina formula.** / Cao, Zongjian; Frey, E. C.; Tsui, B. M.W.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*IEEE Nuclear Science Symposium & Medical Imaging Conference.*pt 2 edn, IEEE Nuclear Science Symposium & Medical Imaging Conference, no. pt 2, Publ by IEEE, pp. 1179-1183, Proceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference, San Francisco, CA, USA, 10/30/93.

}

TY - GEN

T1 - Scatter model for parallel and converging beam SPECT based on the Klein-Nishina formula

AU - Cao, Zongjian

AU - Frey, E. C.

AU - Tsui, B. M.W.

PY - 1994/1/1

Y1 - 1994/1/1

N2 - In this study, a scatter model is derived for parallel-beam, fan-beam, and cone-beam geometries in SPECT imaging. In the model, a photon is allowed to be scattered only once, and the probability of scatter for a given angle and energy is calculated using the Klein-Nishina formula. The detector is assumed to have perfect energy resolution. The scatter counts are computed for every projection array. From the scatter counts, the scatter line source response function and scatter-to-primary ratio are obtained. They agree well with those of Monte Carlo (MC) simulation including only single scattering, but deviate from those of full MC simulation including both single and multiple scattering. The deviation depends on the source depth within the medium. For a source depth of 6 cm, the difference of the scatter-to-primary ratio between the model and full MC simulation is less than 7%, while the difference becomes 27% for parallel-beam and 32% for cone-beam geometry at a source depth of 21.6 cm. Since scatter accounts for 20-40% of the total counts in most clinical studies, the scatter model yields a SPR accuracy ranged from 3% to 12%. The scatter model provides an efficient mean of characterizing scatter response with reasonable accuracy, and can be used in developing scatter compensation techniques in converging-beam SPECT.

AB - In this study, a scatter model is derived for parallel-beam, fan-beam, and cone-beam geometries in SPECT imaging. In the model, a photon is allowed to be scattered only once, and the probability of scatter for a given angle and energy is calculated using the Klein-Nishina formula. The detector is assumed to have perfect energy resolution. The scatter counts are computed for every projection array. From the scatter counts, the scatter line source response function and scatter-to-primary ratio are obtained. They agree well with those of Monte Carlo (MC) simulation including only single scattering, but deviate from those of full MC simulation including both single and multiple scattering. The deviation depends on the source depth within the medium. For a source depth of 6 cm, the difference of the scatter-to-primary ratio between the model and full MC simulation is less than 7%, while the difference becomes 27% for parallel-beam and 32% for cone-beam geometry at a source depth of 21.6 cm. Since scatter accounts for 20-40% of the total counts in most clinical studies, the scatter model yields a SPR accuracy ranged from 3% to 12%. The scatter model provides an efficient mean of characterizing scatter response with reasonable accuracy, and can be used in developing scatter compensation techniques in converging-beam SPECT.

UR - http://www.scopus.com/inward/record.url?scp=0028184989&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028184989&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028184989

SN - 0780314875

T3 - IEEE Nuclear Science Symposium & Medical Imaging Conference

SP - 1179

EP - 1183

BT - IEEE Nuclear Science Symposium & Medical Imaging Conference

PB - Publ by IEEE

ER -