The effects of common errors on sealing ability of total-etch adhesives

Masanori Hashimoto, Franklin R. Tay, Nadia R. Svizero, Anton J.de Gee, Albert J. Feilzer, Hidehiko Sano, Masayuki Kaga, David H. Pashley

Research output: Contribution to journalArticlepeer-review

57 Scopus citations

Fingerprint

Dive into the research topics of 'The effects of common errors on sealing ability of total-etch adhesives'. Together they form a unique fingerprint.

Chemical Compounds

Medicine & Life Sciences

Engineering & Materials Science