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The effects of common errors on sealing ability of total-etch adhesives
Masanori Hashimoto, Franklin R. Tay, Nadia R. Svizero, Anton J.de Gee, Albert J. Feilzer, Hidehiko Sano, Masayuki Kaga, David H. Pashley
Research output: Contribution to journal › Article › peer-review
61
Scopus
citations