TY - JOUR
T1 - Two-dimensional pattern matching by sampling
AU - Crochemore, Maxime
AU - Ga̧sieniec, Leszek
AU - Rytter, Wojciech
N1 - Funding Information:
Correspondence to: M. Crochemore. Institute Gaspard Monge, 2 AlICe Jean Renoir, F-93160 Noisy-le-Grand, France. * Work by the first author is partially supported by NATO Grant CRG 900293. Work by the two other authors is supported by grant KBN 2-11-900-01.
PY - 1993/6/25
Y1 - 1993/6/25
N2 - We extend the concept of deterministic sampling to the two-dimensional pattern matching problem. We show that almost all patterns have a logarithmic deterministic sample. There are 2D-matching algorithms which work efficiently for almost all patterns. They solve the 2D-matching problem in linear sequential time with 0(1) space, or, alternatively in 0(1) parallel time with linear number of processors. This is the first attempt to reduce the space for two-dimensional pattern matching.
AB - We extend the concept of deterministic sampling to the two-dimensional pattern matching problem. We show that almost all patterns have a logarithmic deterministic sample. There are 2D-matching algorithms which work efficiently for almost all patterns. They solve the 2D-matching problem in linear sequential time with 0(1) space, or, alternatively in 0(1) parallel time with linear number of processors. This is the first attempt to reduce the space for two-dimensional pattern matching.
KW - Analysis of algorithms
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U2 - 10.1016/0020-0190(93)90020-A
DO - 10.1016/0020-0190(93)90020-A
M3 - Article
AN - SCOPUS:0027606840
VL - 46
SP - 159
EP - 162
JO - Information Processing Letters
JF - Information Processing Letters
SN - 0020-0190
IS - 4
ER -