Two-dimensional pattern matching by sampling

Maxime Crochemore; Leszek Ga̧sieniec; Wojciech Rytter

doi:10.1016/0020-0190(93)90020-A

Two-dimensional pattern matching by sampling

Maxime Crochemore, Leszek Ga̧sieniec, Wojciech Rytter

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

We extend the concept of deterministic sampling to the two-dimensional pattern matching problem. We show that almost all patterns have a logarithmic deterministic sample. There are 2D-matching algorithms which work efficiently for almost all patterns. They solve the 2D-matching problem in linear sequential time with 0(1) space, or, alternatively in 0(1) parallel time with linear number of processors. This is the first attempt to reduce the space for two-dimensional pattern matching.

Original language	English (US)
Pages (from-to)	159-162
Number of pages	4
Journal	Information Processing Letters
Volume	46
Issue number	4
DOIs	https://doi.org/10.1016/0020-0190(93)90020-A
State	Published - Jun 25 1993
Externally published	Yes

Keywords

Analysis of algorithms

ASJC Scopus subject areas

Theoretical Computer Science
Signal Processing
Information Systems
Computer Science Applications

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